The TEM beam axis was shifted and could not be corrected by the normal alignment procedure. With the help of Oiki-san and Mizuno-san from Center for Medical Research and Education and Yasuda-san from Research Center for Ultra-High Voltage Electron Microscopy, we performed further troubleshooting.
It was also my first time opening the TEM and seeing its internal circuits/control system. This experience gave me a much deeper understanding of how the instrument actually works beyond routine operation.
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